Pasadena, CA

ISTFA 2020


November 17, 2020 - November 18, 2020


Pasadena, CA
Pasadena Convention Center
Pasadena, CA


The International Symposium for Testing and Failure Analysis is the premier event for the microelectronics failure analysis community. Visit TSS Microscopy in booth 421 during the equipment exhibition to learn more about our ReManufactured SEM, TEM, FIB and FIB/SEM instruments and our service and support programs, including programs for legacy instruments.

TSS Microscopy is committed to minimizing transmission of COVID-19 and we are adjusting our operations accordingly.Learn more here