Hitachi SU-70 UHR FEG SEM


Hitachi SU-70 UHR FEG SEM


(TSS#6607) This Hitachi SU-70 Analytical SEM delivers the ultra-high resolution required for a broad range of imaging and analytical applications.
• Schottky Field Emission for UHR imaging: 1 nm/15 kV, 1.6 nm/1 kV (with Beam Deceleration Mode)
• Probe current up to 100 nA
• In-lens SE and BSE signal filtering and mixing
• Large specimen stage and analytical chamber accommodate a range of analytical options such as EDS, WDS, EBSP, CL, STEM
• This system is currently equipped with an Oxford X-Max 50 SDD EDX and EBSD. May be purchased with or without.
• Includes installation, operational training, 90-day warranty

Available Options Include:
• Backscattered electron detector
• Wavelength dispersive X-ray detector
• EBSP detector

Maintenance and Servicing

Need Information On Maintenance or Servicing?

Learn More

Standard Services

installation by tss microscopy included Installation Included 90 Day Warranty 90 Day Warranty Training Basic Operational Training

Optional Upgrades and Services

Annual Service Contracts Available Annual Service Contracts Preventive Maintenance Visits Preventive Maintenance On Demand Service Contacts On Demand Service

Inquire for More Information

Detailed Product Information

Enter your contact information below to request more information about this instrument.
  • This field is for validation purposes and should be left unchanged.
TSS Microscopy is committed to minimizing transmission of COVID-19 and we are adjusting our operations accordingly.Learn more here