(TSS#6607) This Hitachi SU-70 Analytical SEM delivers the ultra-high resolution required for a broad range of imaging and analytical applications.
• Schottky Field Emission for UHR imaging: 1 nm/15 kV, 1.6 nm/1 kV (with Beam Deceleration Mode)
• Probe current up to 100 nA
• In-lens SE and BSE signal filtering and mixing
• Large specimen stage and analytical chamber accommodate a range of analytical options such as EDS, WDS, EBSP, CL, STEM
• This system is currently equipped with an Oxford X-Max 50 SDD EDX and EBSD. May be purchased with or without.
• Includes installation, operational training, 90-day warranty
Available Options Include:
• Backscattered electron detector
• Wavelength dispersive X-ray detector
• EBSP detector