(TSS#6607) 2006 Hitachi SU-70 analytical SEM delivers the ultra-high resolution required for a broad range of imaging and analytical applications.
• Schottky Field Emission for UHR imaging
• Beam Deceleration Mode
• Resolution: 1 nm/15 kV, 1.6 nm/1 kV
• Probe current up to 100 nA
• In-lens SE and BSE signal filtering and mixing
• Large specimen stage and analytical chamber

• Includes installation & operational training (North America)*
* Installation outside of North America will be quoted.
• 90 day warranty

Available Options Include:
• “Used” Oxford X-Max 50 SDD EDX and EBSD