FEI Magellan XHR SEM

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Overview

FEI Magellan XHR SEM

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(TSS#6080) This 2009 Magellan XHR (eXtreme High Resolution) scanning electron microscope is capable of 0.9nm and STEM resolution of 0.8nm STEM.

This FEI Magellan includes:
Elstar XHR electron column:
• Schottky FEG
• 300v–30kV
• In lens SE and BSE detector
Below Lens:
• Everhart-Thornley SE detector (ETD)
• vCD backscatter detector, solid state retractable
• STEM

• Win xP OS and FEI xT UI; TSS networking computer to make IT happy
• Five-axis motorized piezo driven compucentric stage
• XYZTR: 100 x 100 x 20 mm; -10° to +60°; 720° stroke
• Chamber scope for real time observation
• Vacuum System: oil free, PVP, TMP & IGP x 2

• 6 month warranty, installation & operational training (North America)*
* Installation outside of North America will be quoted.

Optional Instrumentation & Equipment
• EDX
• Plasma Cleaner
• UPS

Included With Instrument

Training Basic Operational Training 180 day warranty from TSS Microscopy 180 Day Warranty

Optional Upgrades and Services

Annual Service Contracts Available Annual Service Contracts Preventive Maintenance Visits Preventive Maintenance On Demand Service Contacts On Demand Service

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Detailed Product Information

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