(TSS#6080) This 2009 Magellan XHR (eXtreme High Resolution) scanning electron microscope is capable of 0.9nm and STEM resolution of 0.8nm STEM.

This FEI Magellan includes:
Elstar XHR electron column:
• Schottky FEG
• 300v–30kV
• In lens SE and BSE detector
Below Lens:
• Everhart-Thornley SE detector (ETD)
• vCD backscatter detector, solid state retractable
• STEM

• Win xP OS and FEI xT UI; TSS networking computer to make IT happy
• Five-axis motorized piezo driven compucentric stage
• XYZTR: 100 x 100 x 20 mm; -10° to +60°; 720° stroke
• Chamber scope for real time observation
• Vacuum System: oil free, PVP, TMP & IGP x 2

• 6 month warranty, installation & operational training (North America)*
* Installation outside of North America will be quoted.

Optional Instrumentation & Equipment
• EDX
• Plasma Cleaner
• UPS