The FEI FIB V600 CE 600 designates 150mm diameter sample coverage.  “Original” GIS system is included. This FIB is designed for circuit edit when the sample height interferes with the NanoChemix hardware under the pole piece. Includes installation, operational training and 90 day warranty.

• Sidewinder column 500–30kV
• Milling Power: 21nA beam current
• CDEM for ions and electron images
• Win XP OS and FEI xT; TSS networking computer to make IT happy
• PIA (Patterning, Imaging and Acquisition system)
• 5-axis motorized eucentric tilt stage
• XYZRT: 150 x 150 x 25mm, x n x 360°, x -10°+60°
• Full coverage of 150mm diameter sample
• Chamber scope for real time observation
• Infrared Camera (IR) System
• Gas Injection System: Max 4 injectors; 2 included, chemistry of choice
• Vacuum System oil free consisting of IGP, air cooled Turbo and dry PVP

Available Options Include:
• GIS chemistries
• 65nA upgrade
• Plasma Cleaner