The FEI FIB 200 S is one of our focused ion beam microscopes.
The instrument comes remanufactured and upgraded:
Remanufactured FIB 200 with Sidewinder column for best milling and TEM sample preparation
5 axis stage with 50 x 50 mm XY
2 GIS are included, 2 more are optional; you pick!
Install and custom configuration available.
For more information on this scope and our TSS FIB service offerings, contact our team.