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(TSS#6149) The FEI FIB 200-P uses the pre-lens ion column. This FIB is used for circuit edit (front and back side), defect and failure analysis, TEM lamella prep, nanofabrication, nanoprototyping and MEMS.
This FEI FIB200-P includes:
• Pre-lens column 5-30kV, with excellent beam profile and stability
• Milling Power: 11nA beam current
• CDEM for ions and electron images with 7nm image resolution
• Windows OS and FEI UI; TSS networking computer to make IT happy
• 5-axis, comp-eucentric tilt stage
• Full coverage of 70mm diameter
• Motorized XYXR: 50 x 50 x 25mm x n x 360° x Manual T -15° +60
• Front door load
• Chamber scope for real time observation
• Gas Injection System: Max 4 injectors; 2 included, chemistry of choice
• Vacuum System: column IGP, air cooled Turbo and mechanical PVP
• Includes installation & operational training (North America)*
* Installation outside of North America will be quoted.
• 90 day warranty
Available Options Include:
• GIS chemistries
• Plasma Cleaner
• Infrared camera for backside editing
• Omniprobe for lift out
• Omniprobe for probing
• Dry pump to replace mechanical oil PVP