Consumables

TSS Microscopy provides consumables – including sources, detectors and cables – for FEI DualBeam, SEM, TEM, FIB. Please contact us with your instrument model so we can provide you with a quotation.

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Consumables
10 Results
Model
Price
Description
Square style CDEM detector for first generation FIB/DB We also have the round, newer style. Click to see the bullet style detector.