Instruments

TSS Microscopy offers a diverse selection of pre-owned, remanufactured SEM, TEM, FIB or Dual Beam microscopes and accessories from all the major manufacturers.

Testimonial

“We use the CM10 on a daily basis for specimen screening and data collection for single-particle EM of negatively stained specimens. I have already recommended TSS several times.”

- The Rockefeller University
Model - CM10