Analytical Lab Services
TSS Microscopy's Analytical Services lab is equipped with field emission SEM, field emission TEM/STEM and 300mm DualBeam microscopes, plus EDX, EBSD, STEM, and GIF capabilities.

For Your Convenience,
7 Days a Week
- Semiconductor failure & process analysis
- Circuit design & edit
- Materials analysis
- Life sciences imaging
- TEM sample preparation
Contact TSS Analytical Services for your materials analysis needs.
Call +1 503 616 4710 x 203 or simply email analytical@tssmicroscopy.com
For requests outside of our normal business hours (Pacific Time Zone), please text +1 503 781 0428.
Instruments Available
Our analytical lab microscopes include:
FEI Helios 1200+ 300mm full wafer DualBeam
FEI Helios DualBeam small stage systems
High Resolution, Aberration Corrected SEM
Circuit Edit FIB System
FEI Tecnai F20 TEM/STEM- GIF